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J. Appl. Cryst. (2010). 43, 466-472
https://doi.org/10.1107/S0021889810008484
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An investigation of goethite-seeded Al(OH)3 precipitation using in situ X-ray diffraction and Rietveld-based quantitative phase analysis

N. A. S. Webster, I. C. Madsen, M. J. Loan, R. B. Knott, F. Naim, K. S. Wallwork and J. A. Kimpton
In situ X-ray diffraction has been used to investigate goethite-seeded Al(OH)3 precipitation from synthetic Bayer liquor at 343 K. Rietveld-based quantitative phase analysis has allowed for the determination of the absolute phase abundances of the precipitated phases and for the determination of kinetic information.
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