search results
results of search on CRYSTALLOGRAPHY JOURNALS ONLINE
1 citation found for Le Cunff, D.
Search for Le Cunff, D. in the World Directory of Crystallographers
![j logo](https://journals.iucr.org/logos/jicons/j_36x36.png)
A detailed theoretical and experimental comparison of dark-field electron holography and high-resolution X-ray diffraction is performed. Both techniques are applied to measure elastic strain in an array of metal–oxide–semiconductor field-effect transistors (MOSFETs) and the role of the geometric phase is emphasized.