A beginner's guide to radiation damage

Radiation damage considerations affecting data collection by more than a factor of two are summarized and damage avoidance strategies are suggested.

Determination of X-ray flux using silicon pin diodes

Accurate measurement of photon flux from an X-ray source is a parameter required to calculate the dose absorbed by a sample. The development of a model for determining the photon flux incident on pin diodes, and experiments to test this model, are described for incident energies between 4 and 18 keV used in macromolecular crystallography.