Advances in array detectors for X-ray diffraction techniques

Recent developments in solid-state imaging technologies have provided a framework for faster, lower noise and larger format systems than previously available. Advances which have not found widespread use in instrumentation for X-ray diffraction include highly parallel readout amplifiers, hybrid imaging technologies and improved CMOS imagers. These advances are discussed and simulations are presented of selected devices incorporated into a new generation of instrumentation for Laue diffraction applications.