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The possibility of using X-ray diffraction to precisely monitor crystal structure at the extremes of pressure and temperature is explored. A summary of the advantages of using various X-ray sources for this work and an outline of the necessary experimental layout is given.

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A new high-pressure facility for diffraction and spectroscopy using diamond anvil high-pressure cells has been developed at the Advanced Light Source. Details of the mechanics and performance of the beamline and endstation are given.
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