Performance of a dispersion-compensating scanning X-ray spectrometer for Compton profile measurements

N. Hiraoka, T. Buslaps, V. Honkimäki and P. Suortti

A new Compton spectrometer, constructed at beamline ID15B of the ESRF, is described. This spectrometer is based on a novel idea, the dispersion compensation.

Keywords: X-ray spectrometer; Compton scattering; dispersion compensation.

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Format		BIBTeX
		EndNote
		RefMan
		Refer
		Medline
		CIF
		SGML
		Text
		Plain Text