Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

search IUCr Journals

home archive editors for authors for readers submit subscribe open access

journal menu

home archive editors for authors for readers submit subscribe open access

research papers

Issue contents close

Article statistics

Download citation

Format		BIBTeX
		EndNote
		RefMan
		Refer
		Medline
		CIF
		SGML
		Text
		Plain Text

Download PDF of article close

J. Appl. Cryst. (2010). 43, 550-559
https://doi.org/10.1107/S0021889810009143

Download PDF of article close

Download citation

Format		BIBTeX
		EndNote
		RefMan
		Refer
		Medline
		CIF
		SGML
		Text
		Plain Text

Article statistics

Issue contents close

Implementation of statistical dynamic diffraction theory for defective semiconductor heterostructure modelling

P. K. Shreeman and R. J. Matyi

A modified method for implementing statistical dynamic diffraction theory is presented, along with its application to structurally defective semiconductor heterostructures.

Keywords: statistical dynamic diffraction theory; defect-induced structures; high-resolution X-ray diffraction; structure modelling.

Read article Similar articles

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page

Copyright © International Union of Crystallography
Home Contact us Site index About us Partners and site credits Help Terms of use Privacy and cookies

The IUCr is a scientific union serving the interests of crystallographers and other scientists employing crystallographic methods.