Download citation
Download citation

link to html
X-ray scanning microscopy greatly benefits from a reduced emittance of synchrotron radiation sources, especially from a diffraction-limited storage ring. Nanofocusing is discussed in view of focus size, flux and coherence.

Download citation
Download citation

link to html
A Ronchi interferometer for hard X-rays was used to characterize the performance of nanofocusing optics and beamline stability. The interferometer proved capable of obtaining qualitative data on optics aberrations, beamline spatial coherence, and pin-point vibrations and drift of beamline components.

Download citation
Download citation

link to html
Results of ptychographic characterization of point focusing with multilayer Laue lenses are discussed. Analysis of an integrated test sample shows the potential of this set-up for future measurements.
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds