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A description of a new optical-transport-based set-up dedicated to soft X-ray magnetic resonant scattering in extreme sample environment, i.e. ultra-high vacuum, high magnetic fields and very low temperatures, is given.

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Metal-oxide tunnel junctions made by optical lithography were studied by X-ray diffraction (imaging approach with diffraction contrast) to access local distortions of the crystalline planes of the constituting layers. The effect of the size (10-150 µm) and shape (disc, square and rectangle) of the junction was investigated.
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