Download citation
Download citation

link to html
A set-up is presented to measure element-resolved magnetization dynamics with a temporal resolution well below 100 ps in the time domain. X-ray resonant magnetic scattering with a diffractometer set-up enables the investigation of magnetic thin films, multilayers and laterally structured samples.
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds