Scanning X-ray nanodiffraction from ferroelectric domains in strained K_0.75Na_0.25NbO₃ epitaxial films grown on (110) TbScO₃

Scanning X-ray nanodiffraction with 100 nm spatial resolution has been applied to investigate the ferroelectric domain structure of K_0.75Na_0.25NbO₃ epitaxial layers grown on a (110) TbScO₃ substrate using metal–organic chemical vapour deposition. Two variants differing in domain wall alignment and vertical lattice parameters have been identified and independently analysed.