Download citation
Download citation

link to html
The principles of continuous multiple-beam diffraction occurring within special crystallographic planes of cubic structures and the procedure to determine such planes are illustrated for optimization of X-ray monochromator designs and for general X-ray multiple-beam diffraction characterization of cubic structure crystals.
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds