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Soft X-ray back-diffraction (XBD) is explored in an ultra-thin Si(220) crystal. Extreme XBD measurements show close agreement with theory, opening up new possibilities in X-ray optics.

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All the possible kinds of phase-transition-induced domain structures in the insulating M1 and M2 phases of vanadium dioxide were theoretically predicted using a general space group method and characterized by transmission electron microscopy.
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