Journal of Applied Crystallography
Journal of Applied
Crystallography
IUCr
IT
WDC
search IUCr Journals
home
archive
editors
for authors
for readers
submit
subscribe
open access
journal menu
home
archive
editors
for authors
for readers
submit
subscribe
open access
research papers
Share
Share
Issue contents
Article statistics
Download citation
Format
BIBTeX
EndNote
RefMan
Refer
Medline
CIF
SGML
Text
Plain Text
Download PDF of article
J. Appl. Cryst.
(2014).
47
,
84-94
https://doi.org/10.1107/S1600576713028549
Download PDF of article
Download citation
Format
BIBTeX
EndNote
RefMan
Refer
Medline
CIF
SGML
Text
Plain Text
Article statistics
Issue contents
Share
Modelling of high-symmetry nanoscale particles by small-angle scattering
C. Alves
,
J. S. Pedersen
and
C. L. P. Oliveira
A versatile procedure to build high-symmetry objects and calculate their corresponding theoretical small-angle scattering intensity is presented, enabling the modelling and fitting of experimental data for very complex models.
Keywords:
small-angle X-ray scattering
;
modelling
;
self-assembly
;
DNA
;
computing
;
high symmetry
.
Read article
Similar articles
Follow J. Appl. Cryst.
E-alerts
Twitter
Facebook
RSS