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J. Appl. Cryst. (2014). 47, 160-165
https://doi.org/10.1107/S1600576713028677
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Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning

Z. G. Amirkhanyan, C. M. R. Remédios, Y. P. Mascarenhas and S. L. Morelhão
Small changes in atomic coordinates caused by internal stresses in doped single crystals are investigated. Invariant phases are measured via X-ray multiple diffraction experiments.
Keywords: X-ray multiple diffraction; invariant phases; doping.
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