Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter

H. Wang, P. Bencok, P. Steadman, E. Longhi, J. Zhu and Z. Wang

The complete polarization analysis for both the linear arbitrary polarization and the various ellipticities of an APPLE II undulator using a multilayer-based soft X-ray polarimeter is shown.

Keywords: polarization; multilayers; undulators.

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Format		BIBTeX
		EndNote
		RefMan
		Refer
		Medline
		CIF
		SGML
		Text
		Plain Text