share
share
Issue contentsclose
Statistics
close
Download citation
closeDownload citation
Format BIBTeX
EndNote
RefMan
Refer
Medline
CIF
SGML
Text
Plain Text
Download PDF of article
Download PDF of articleclose
J. Synchrotron Rad. (1999). 6, 957-963
https://doi.org/10.1107/S0909049599008092
Download PDF of article
Download PDF of articleclose
Download citation
closeDownload citation
Format BIBTeX
EndNote
RefMan
Refer
Medline
CIF
SGML
Text
Plain Text
Statistics
close
Issue contentsclose
share

link to html

Optical layout of a beamline for photoemission microscopy

T. Schmidt, J. Slezak, S. Heun, J. Diaz, R. R. Blyth, R. Delaunay, D. Cocco, K. C. Prince, E. Bauer and M. Coreno
The optical layout of a soft X-ray photoemission microscopy beamline using a full-field microscope is described. Fresnel diffraction of the synchrotron light is a nano-scale system is observed.
Keywords: photoemission microscopy; beamlines; Fresnel diffraction.
Read articleSimilar articles
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS