On the significance of Bragg reflections

The statistical descriptor, W, recently introduced by Henn & Meindl [Acta Cryst. (2010), A66, 676–684] is modified to include the scale factors introduced in data processing, and the effects of using empirical error models on the final significance distribution are discussed.

Maximum-entropy-method charge densities based on structure-factor extraction with the commonly used Rietveld refinement programs GSAS, FullProf and Jana2006

Synchrotron powder X-ray diffraction data are analysed with generally available Rietveld refinement software and strategies are suggested for subsequent calculation of maximum-entropy-method charge densities.