addenda and errata
Errors in the article by Mocuta, Richard, Fouet, Stanescu, Barbier, Guichet, Thomas, Hustache, Zozulya & Thiaudière [J. Appl. Cryst. (2013), 46, 1842-1853
] are corrected.
research papers
A new quick continuous mapping technique that comes together with a software package (XSOCS) for automatic data analysis for strain and lattice orientation is presented as a novel type of scanning probe microscope.