Download citation
Download citation

link to html
Energy-dispersive synchrotron diffraction was applied to analyse the near-surface residual stress state in polycrystalline materials. A Rietveld-based formalism is introduced which permits a full triaxial data evaluation and, therefore, even the detection of out-of-plane σ33(z) gradients.
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds