Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry

A new reciprocal-space vector method is developed, which provides a practical and concise route to crystal structure studies of epitaxial thin films.

Intra-layer ordering and inter-layer disordering of the Li₂MnO₃ phase in Li_1.07Mn_1.93O_4–δ cathode materials: electron diffraction investigation and DIFFaX simulation of X-ray diffraction patterns

Transmission electron microscopy (TEM) analysis indicates the coexistence of three 120° monoclinic twinning variants in the Li_1.07Mn_1.93O_4−δ cathode materials. A theoretical investigation of the influence of stacking disorder on the X-ray diffraction (XRD) patterns was performed by employing the DIFFaX program and may help to clarify the ambiguity between experimental TEM and XRD investigations.

Transmission electron microscopy analysis of the crystallography of precipitates in Mg–Sn alloys aged at high temperatures

The crystallographic orientation relationships of precipitated β-Mg₂Sn particles in Mg–9.76 wt% Sn alloy aged at 573 K for 5 h were investigated by advanced transmission electron microscopy (TEM). Models of the interface of precipitated β-Mg₂Sn and the α-Mg matrix were constructed via high-resolution TEM and atomic resolution high-angle annular dark-field scanning TEM.