Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(2012).
45
,
826-833
https://doi.org/10.1107/S0021889812027665
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Strains in light-ion-implanted polycrystals: influence of grain orientation
A. Richard
,
H. Palancher
,
É Castelier
,
J.-S. Micha
,
M. Gamaleri
,
G. Carlot
,
H. Rouquette
,
P. Goudeau
,
G. Martin
,
F. Rieutord
,
J. P. Piron
and
P. Garcia
Micro X-ray diffraction and mechanical modeling on low-energy (60 keV) light-ion (He)-implanted polycrystals have shown that the strain tensor has only three nonzero components, which depend on grain orientation.
Keywords:
micro X-ray diffraction
;
polycrystals
;
light-ion implantation
;
grain orientation
.
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