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A fast and robust methodology is developed for the analysis of two-dimensional diffraction data containing peak overlap, acquired from polycrystalline materials consisting of thousands of grains using three-dimensional X-ray diffraction. This first part outlines the procedure for the accurate identification and characterization of overlapping diffraction peaks and the determination of the parameters of the experimental setup without the need for calibration samples.

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A fast and robust methodology is developed for the analysis of two-dimensional diffraction data acquired from samples containing thousands of grains using three-dimensional X-ray diffraction. This second part deals with the procedure for the determination of grain characteristics. The volume, crystallographic orientation, centre-of-mass position and strain state of individual grains can be determined simultaneously.
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