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J. Appl. Cryst. (2014). 47, 1889-1900
https://doi.org/10.1107/S1600576714020445

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Structure and composition of bismuth telluride topological insulators grown by molecular beam epitaxy

H. Steiner, V. Volobuev, O. Caha, G. Bauer, G. Springholz and V. Holý

Epitaxial layers of topological insulators of Bi₂Te_3−δ grown by molecular-beam epitaxy are investigated by high-resolution X-ray diffraction.

Keywords: bismuth telluride; topological insulators; molecular beam epitaxy.

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