Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(2014).
47
,
762-769
https://doi.org/10.1107/S1600576714004506
Download PDF of article
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Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping
G. A. Chahine
,
M.-I. Richard
,
R. A. Homs-Regojo
,
T. N. Tran-Caliste
,
D. Carbone
,
V. L. R. Jacques
,
R. Grifone
,
P. Boesecke
,
J. Katzer
,
I. Costina
,
H. Djazouli
,
T. Schroeder
and
T. U. Schülli
A new quick continuous mapping technique that comes together with a software package (
XSOCS
) for automatic data analysis for strain and lattice orientation is presented as a novel type of scanning probe microscope.
Keywords:
reciprocal space mapping
;
strain
;
lattice orientation
;
data analysis software
;
scanning X-ray diffraction microscopy
;
scanning probe microscopy
.
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