Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(2013).
46
,
639-643
https://doi.org/10.1107/S0021889813007693
Download PDF of article
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Surface diffraction on a ψ-circle diffractometer using the χ-axis geometry
T. T. Fister
,
P. H. Fuoss
,
D. D. Fong
,
J. A. Eastman
,
C. M. Folkman
,
S. O. Hruszkewycz
,
M. J. Highland
,
H. Zhou
and
P. Fenter
An alternative configuration for a ψ-circle diffractometer is discussed, such that the sample normal is along the χ-circle axis. Reciprocal space calculations for specular and nonspecular surface diffraction are described in detail.
Keywords:
surface diffraction
;
diffractometer configuration
.
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