Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

M. Neuschitzer, A. Moser, A. Neuhold, J. Kraxner, B. Stadlober, M. Oehzelt, I. Salzmann, R. Resel and J. Novák

A setup for grazing-incidence in-plane X-ray diffraction using standard laboratory equipment and its application for organic thin-film and monolayer characterization is described.

Keywords: grazing-incidence in-plane X-ray diffraction; thin films; monolayers.

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