Journal of Synchrotron Radiation
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J. Synchrotron Rad.
(2014).
21
,
1262-1268
https://doi.org/10.1107/S1600577514016488
Download PDF of article
Download citation
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High-throughput synchrotron X-ray diffraction for combinatorial phase mapping
J. M. Gregoire
,
D. G. Van Campen
,
C. E. Miller
,
R. J. R. Jones
,
S. K. Suram
and
A. Mehta
A newly developed high-throughput X-ray diffraction and fluorescence experiment is capable of measuring more than 5000 samples per day, meeting the structural characterization needs for high-throughput material genomic searches.
Keywords:
combinatorial materials science
;
high-throughput phase mapping
;
X-ray diffraction
;
X-ray fluorescence
.
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