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Quantitative measurements of the deformations of a silicon double-crystal monochromator under heat load from a wiggler source are reported. The deformations were measured using two-dimensional hard X-ray grating interferometry, a technique that enables in situ at-wavelength wavefront investigations with high angular sensitivity.

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An efficient computing simulation routine has been implemented to model explicitly several types of Fresnel zone plate taking advantage of the circular symmetry. This code was used to evaluate an optimized approach for stacking of two high-resolution Fresnel zone plates.

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The wiggler X-ray source of the Materials Science beamline at the Swiss Light Source has been replaced with a 14 mm-period cryogenically cooled in-vacuum undulator. In order to best exploit the increased brilliance of this new source, the entire front-end and optics have been redesigned.
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