Advantages of a synchrotron bending magnet as the sample illuminator for a wide-field X-ray microscope

An optimized beamline design is presented for hard X-ray full-field microscopy using bending-magnet radiation.

A 30 nm-resolution hard X-ray microscope with X-ray fluorescence mapping capability at BSRF

The successful design and performance of a transmission X-ray microscope with X-ray fluorescence mapping capability at a first-generation synchrotron light source is described.