A novel fast Fourier transform accelerated off-grid exhaustive search method for cryo-electron microscopy fitting

This paper presents a novel fast Fourier transform based exhaustive search method extended to off-grid translational and rotational degrees of freedom; it is applied to the cryo-electron microscopy fitting problem.

Keywords: cryo-EM fitting; fast Fourier transform; FFT; exhaustive search; off-grid search; trust-region problem.

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