Journal of Applied Crystallography
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Crystallography
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J. Appl. Cryst.
(2014).
47
,
1472-1476
https://doi.org/10.1107/S1600576714010140
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Spurious peaks arising from multiple scattering events involving the sample environment in inelastic neutron scattering
L. Pintschovius
,
D. Reznik
,
F. Weber
,
P. Bourges
,
D. Parshall
,
R. Mittal
,
S. L. Chaplot
,
R. Heid
,
T. Wolf
,
D. Lamago
and
J. W. Lynn
A new type of artifact is described, which was observed in a wide variety of inelastic neutron scattering spectra and which could easily be mistaken for a signature of real excitations.
Keywords:
inelastic neutron scattering
;
spurious signals
;
single-crystal experiments
;
powder experiments
;
triple-axis technique
;
time-of-flight technique
;
sample environment
.
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