Two-dimensional approach to fluorescence yield XANES measurement using a silicon drift detector

Partial fluorescence yield XANES measurements were performed using a silicon drift detector in the soft X-ray region. This technique provides unambiguous XANES data in the soft X-ray region, where absorption edges of different elements are close to each other, or where fluorescence lines overlap.

Two-dimensional approach to fluorescence yield XANES measurement using a silicon drift detector. Erratum

An error in the paper by Tamenori et al. [(2011), J. Synchrotron Rad. 18, 747-752] is corrected.