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A noncoplanar measurement geometry, achieved by using a diffractometer equipped with a detector arm possessing two degrees of freedom, is a promising technique for the analysis of residual stress gradients in polycrystalline objects and for anisotropic microstructure investigations.

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A methodology to use a laboratory X-ray diffractometer equipped with an in-plane arm to determine residual stress gradients is presented. The approach is based on an in-plane arm rotation and a characterization of several reflections to achieve a variation of X-ray penetration depth even without sample inclination.
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