Robust structure and morphology parameters for CdS nanoparticles by combining small-angle X-ray scattering and atomic pair distribution function data in a complex modeling framework

A complex modeling approach that combines atomic pair distribution function and small-angle X-ray scattering data from CdS quantum dots yields more robust and accurate structural and morphological parameters when compared with either single technique alone.

On the estimation of statistical uncertainties on powder diffraction and small-angle scattering data from two-dimensional X-ray detectors

It is difficult to estimate statistical uncertainties from powder diffraction data collected on two-dimensional detectors. Here, different approaches are compared and best practices suggested if the full variance–covariance matrix can be propagated, as well as the best approximate approach when only the variances are propagated.