Residual stress analysis of diamond-coated WC–Co cutting tools: separation of film and substrate information by grazing X-ray diffraction

In order to determine the residual stress state of thin diamond coatings that are deposited on WC–Co substrates, an approach to separating the overlapping reflections of diamond and cobalt, based on grazing diffraction conditions, is presented. For verification of the experimental results, complementary Raman spectroscopy measurements were performed.