Advances in X-ray diffraction contrast tomography: flexibility in the setup geometry and application to multiphase materials

Recent developments in the use of the diffraction contrast tomography method to create three-dimensional grain maps of polycrystalline samples are described. These include the use of detectors in arbitrary positions, including high Bragg angles, and the application to multiphase materials.

Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization

Corresponding two-dimensional grain maps from the diffraction contrast tomography and electron backscatter diffraction characterization methods were aligned and compared, focusing on the spatial resolution at the internal interfaces. The compared grain boundary networks show a remarkably good agreement both morphologically and in crystallographic orientation.

First laboratory X-ray diffraction contrast tomography for grain mapping of polycrystals

The first results of nondestructive three-dimensional grain mapping in polycrystals using diffraction contrast from a laboratory X-ray source are presented and the method described.