Coating thickness determination in highly absorbent core-shell systems

H. Palancher, A. Bonnin, V. Honkimäki, H. Suhonen, P. Cloetens, T. Zweifel, R. Tucoulou, A. Rack and M. Voltolini

A single-shot methodology to derive an average coating thickness in multi-particle core-shell systems exhibiting a high X-ray absorption is presented. This approach is based on X-ray nanotomography and high-energy X-ray diffraction.

Keywords: high-energy X-ray diffraction; powder diffraction; Rietveld refinement; low-enriched nuclear fuels; nanotomography.

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