Unambiguous indexing of trigonal crystals from white-beam Laue diffraction patterns: application to Dauphiné twinning and lattice stress mapping in deformed quartz

Synchrotron X-ray Laue microdiffraction is used to investigate the microstructure of deformed quartz. The unambiguous indexing of the Laue diffraction pattern can only be achieved by taking the intensities of the diffraction peaks into account.