Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors

Depth-resolved microbeam diffraction was used to measure diffraction line profiles from numerous individual dislocation cell walls and cell interiors in a heavily deformed Cu single crystal, allowing the construction of the cell-interior and cell-wall subprofiles that have been approximated in the line profile analysis literature for the past 30 years. Comparison of the reconstructed subprofiles and the macroscopic asymmetric line profile from the same sample allows the first direct tests of many of the assumptions that have been used in such analyses.