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J. Synchrotron Rad. (2014). 21, 1122-1127
https://doi.org/10.1107/S1600577514014556
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Ptychography with multilayer Laue lenses

A. Kubec, S. Braun, S. Niese, P. Krüger, J. Patommel, M. Hecker, A. Leson and C. G. Schroer
Results of ptychographic characterization of point focusing with multilayer Laue lenses are discussed. Analysis of an integrated test sample shows the potential of this set-up for future measurements.
Keywords: multilayer Laue lens; X-ray nanofocusing; ptychography; scanning X-ray microscopy.
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