Download citation
Download citation

link to html
Quantitative measurements of the deformations of a silicon double-crystal monochromator under heat load from a wiggler source are reported. The deformations were measured using two-dimensional hard X-ray grating interferometry, a technique that enables in situ at-wavelength wavefront investigations with high angular sensitivity.
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds