Capability of insulator study by photoemission electron microscopy at SPring-8

T. Ohkochi, M. Kotsugi, K. Yamada, K. Kawano, K. Horiba, F. Kitajima, M. Oura, S. Shiraki, T. Hitosugi, M. Oshima, T. Ono, T. Kinoshita, T. Muro and Y. Watanabe

A photoemission electron microscopy measurement system on insulating samples was established at the BL17SU beamline of SPring-8 by utilizing an Au pattern evaporation technique combined with photon-induced surface modification.

Keywords: PEEM; insulator; ferrite; evaporator; photon-induced surface conductivity.

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