New capabilities for `colouring in' the chemistry of crystal defects atom-by-atom

The latest generation of scanning transmission electron microscopes equipped with high-efficiency energy-dispersive X-ray detectors are breaking new ground with respect to high-resolution elemental imaging of materials. In this issue, Paulauskas et al. [Acta Cryst. (2014), A70, 524-531 ] demonstrate impressive results when applying this technique to improve understanding of CdTe dislocation structures.