High-resolution X-ray diffraction and imaging

This issue of Journal of Applied Crystallography includes some highlights of the 11th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), held in St Petersburg in 2012.

Three-wave X-ray diffraction in distorted epitaxial structures

Three-wave diffraction has been experimentally studied for a set of III–nitride and ZnO epitaxial films differing in thickness and structural perfection. Properties of the multiple diffraction pattern in highly distorted layers are analyzed.