High-resolution X-ray diffraction and imaging

P. F. Fewster, M. V. Baidakova and R. Kyutt

This issue of Journal of Applied Crystallography includes some highlights of the 11th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), held in St Petersburg in 2012.

Keywords: high-resolution X-ray diffraction; imaging; editorial.

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Format		BIBTeX
		EndNote
		RefMan
		Refer
		Medline
		CIF
		SGML
		Text
		Plain Text