Assessing noise sources at synchrotron infrared ports

P. Lerch, P. Dumas, T. Schilcher, A. Nadji, A. Luedeke, N. Hubert, L. Cassinari, M. Boege, J.-C. Denard, L. Stingelin, L. Nadolski, T. Garvey, S. Albert, Ch. Gough, M. Quack, J. Wambach, M. Dehler and J.-M. Filhol

Low-frequency noise present in the electron and photon beams of two comparable storage rings, SOLEIL and SLS, are carefully compared in the context of IR spectroscopy using the Fourier transform technique.

Keywords: noise; FTIR; spectroscopy.

Read article Similar articles

Format		BIBTeX
		EndNote
		RefMan
		Refer
		Medline
		CIF
		SGML
		Text
		Plain Text

Format		BIBTeX
		EndNote
		RefMan
		Refer
		Medline
		CIF
		SGML
		Text
		Plain Text

Search IUCr Journals		doi		Advanced search
Author		volume	page