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A novel computer program, EBSDL, has been successfully developed to determine the unknown Bravais lattice of a bulk crystalline material using a single electron backscatter diffraction (EBSD) pattern. Unlike the phase identification technique in conventional EBSD applications, the new technique is completely independent of chemical information.

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On the basis of a systematic analysis of the small-angle X-ray scattering of carbon fiber and its graphitic forms, an intensity component indicating a relatively large scatterer was found and ascribed to the amorphous structure. Results indicated that the amorphous regions decreased in dimension and finally transformed completely into voids as the heat treatment temperature rose to 2773 K.
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