Diffraction stress analysis of highly planar-faulted, macroscopically elastically anisotropic thin films and application to tensilely loaded nanocrystalline Ni and Ni(W)

A convenient, efficacious stress analysis for highly planar-faulted, fibre-textured films is presented, separating the fault-induced and the stress-induced diffraction-peak shifts. This method is applied to an Ni(W) film during tensile testing, highlighting the enormously enhanced stiffness and strength compared to a pure Ni film.

Measurement of X-ray diffraction-line broadening induced by elastic mechanical grain interaction

This work provides a report of synchrotron diffraction investigations dedicated to the measurement of the experimentally observable diffraction-line broadening induced by external elastic loading of various polycrystalline specimens. The experimentally obtained broadening data have been compared with those calculated adopting various grain-interaction models.