Lattice strain distribution resolved by X-ray Bragg-surface diffraction in an Si matrix distorted by embedded FeSi₂ nanoparticles

The elastic strain distribution in an Si lattice distorted by embedded spherical- and plate-shaped nanoparticles was resolved by synchrotron X-ray multiple diffraction as a function of the incident beam energy. Mappings of the (111) Bragg-surface diffraction peak profile have revealed a striking anisotropic effect, predominantly induced by oriented plate-like nanoparticles.